| Surface
Inspection System for Industrial Applications (SISIA) |
| CTI
5697.2 TNS |
Development
of a portable surface inspection system for industrial applications
with millimeter stroke and nanometer resolution. |
Mecartex was in collaboration for this project with : - EPFL-IPR-LSRO (Swiss Federal Institute of Technology) - NANOSURF - SUPSI - HEVS |
Publications
- Downloads |
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